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課程名稱 |
自動化光學檢測原理與應用
Theory and Applications of Automated Optical Inspection |
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開課學期 |
103-2 |
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授課對象 |
工學院 機械工程學系 |
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授課教師 |
陳亮嘉 |
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課號 |
ME5245 |
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課程識別碼 |
522 U5320 |
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班次 |
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學分 |
3 |
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全/半年 |
半年 |
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必/選修 |
選修 |
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上課時間 |
星期二6,7,8(13:20~16:20) |
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上課地點 |
新404 |
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備註 |
總人數上限：40人 |
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Ceiba 課程網頁 |
http://ceiba.ntu.edu.tw/1032ME5245_ |
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課程簡介影片 |
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核心能力關聯 |
核心能力與課程規劃關聯圖 |
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課程大綱
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課程概述 |
This subject is arranged to introduce the theory and techniques
required in Automatic Optical Inspection (AOI) as well as its applications in
various industries. The subject mainly includes the following subtopics:
introduction to precision metrology and machine vision, the measurement &
detection principles and methods used in the 2D AOI, the detection &
measurement principles and techniques used in the 3D AOI, image processing
and algorithm methods used in automatic inspection, special topic from experts
from industries, system instrumentation, factory visit, and lab practice work. |
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課程目標 |
課程教學目標：
1. To familiarize with fundamentals, theories and techniques required in AOI technology.
2. To understand key issues in system design and operations in AOI.
3. To establish the fundamentals of instrumentation needed in AOI.
4. To establish hands-on skills of AOI
Important notes: the lecture will be conducted in Chinese but additional English hours will be provided to overseas students. |
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課程要求 |
U1.具備學理基礎及應用工程知識與技術之能力。
U2.具備設計與執行實驗，以及發掘、分析、解釋、處理問題之能力。
U3.具備設計系統、元件、製程及工程規劃與整合及創新之能力。
U4.具備執行工程實務之相關知識與技能以因應科技及工業發展的需求。
U5.認識當前與機械工程相關之先進科技與時事議題，並具備整合跨領域知識之能力。
U6.具備團隊合作之精神，有良好之表達溝通、運用外語及領導與管理之能力。
U7.具備端正之品行、健全的人格、熱心服務及重視專業倫理之精神。
本系研究所學生養成之核心能力如下：
G1.具備機械工程之專業知識與技術。
G2.具備策劃及執行專題研究之能力。
G3.具備撰寫技術報告及論文之能力。
G4.具備創新思考及獨立解決問題之能力。
G5.具備與不同領域人員協調整合之能力。
G6.具備國際觀及良好的外語能力。
G7.具備終身自我學習成長之能力。 |
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預期每週課後學習時數 |
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Office Hours |
每週六 14:00~15:00 備註： Additional English session |
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指定閱讀 |
the same as below |
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參考書目 |
Textbook: Automated optical inspection, 自動化光學檢測 (ISBN 978-986-378-009-0), 高立圖書， 陳亮嘉等人著.
Updated lecturing notes: to be downloaded from the Ceiba before each class.
Reference books： (1) Optical metrology: K. J. Gasvik, ISBN: 0-470-84300-4, Wiley, 3rd Edition; (2) Digital Image Processing: R. C. Gonzalez and R. E. Woods, third edition, 978-986-154-762-6;
Others:
1. Industrial Image Processing: Visual Quality Control in Manufacturing
2. by Christian Demant, Bernd Streicher-Abel, Peter Waszkewitz
Springer Verlag; ISBN: 3540664106; Bk&Cd Rom edition (December 1999)
3. Videometrics and Optical Methods for 3D Shape Measurement
by Sabry F. El-Hakim (Editor), Armin Gruen (Editor), SPIE-Intl Society for
Optical Engineering; ISBN: 0819439878; (December 2000)
4. Optical Methods in Engineering Metrology (****)
D.C. Williams Chapman & Hall; ISBN: 0412396408; (January 1993)
5. Optical Techniques for Industrial Inspection (****)
by Paolo G. Cielo (Editor)
Academic Press; ISBN: 0121746550; (November 1997)
6. Visual and Optical Testing (Nondestructive Testing Handbook, Vol 8)
by Michael W. Allgaier, et al (Hardcover - September 1993) Amer Society for
Nondestructive Testing; ISBN: 0931403057; (September 1993)
7. Machine Vision: General Systems Robotic Systems Special Systems
Components Accessories Optical Inspection (Productivity Equipment Series)
by Society of Manufacturing Engineers Society of Manufacturing Engineers;
ISBN: 0872631559; (December 1984)
8. Simulation and Experiment in Laser Metrology
by Z. Fzessy (Editor), Werner Jptner (Editor), Wolfgang Osten (Editor)
John Wiley & Sons; ISBN: 3527401423; (August 1996)
9. Holographic Interferometry: Principles and Methods
by Thomas Kreis, Wolfgang Osten (Editor) John Wiley & Sons; ISBN:
3055016440; (June 25, 1996)
10. Machine Vision: Automated Visual Inspection and Robot Vision
by David Vernon Prentice Hall; ASIN: 0135433983; (September 1991)
11. Computer Vision, Models and Inspection (Series in Robotics and Automated
Systems, Vol. 4)
by A. D. Marshall, R. R. Martin World Scientific Pub Co; ISBN: 9810207727;
(April 1992)
12. Optical Sensors, Volume 6, Sensors: A Comprehensive Survey
by E. Wagner, R. Dandliker, K. Spenner (Editor) John Wiley & Sons; ISBN:
3527267727; (December 15, 1991)
Conference Proceedings:
1. Automatic Optical Inspection (Spie, Vol 654)
by Lionel R. Baker (Paperback - October 1986) Society of Photo-optical
Instrumentation Engineers; ISBN: 0892526890; (October 1986)
2. Integrated Circuit Metrology, Inspection, and Process Control (Proceedings
of Spie--The International Society for Optical Engineering, Vol 775)
by Kevin M. Monahan (Editor) Society of Photo-optical Instrumentation
Engineers; ASIN: 0892528109; (July 1987)
3. Industrial Applications of Optical Inspection, Metrology and Sensing
(Proceedings of S P I E, Vol 1821)
by H.P. Stahl, Gordon M. Brown, Kevin G. Harding (Editor) Society of
Photo-optical Instrumentation Engineers; ISBN: 0819410225; (November 1992)
4. Optical Measurement Systems for Industrial Inspection (Europto)
by Malgorzata Kujawinska (Editor), Wolfgang Osten (Editor) Society of
Photo-optical Instrumentation Engineers; ISBN: 0819433101; (September 1999)
5. Three-Dimensional Imaging, Optical Metrology, and Inspection IV: 2-3
November, 1998 & 1999, Boston, Massachusetts (Proceedings of Spie)
by Kevin G. Harding (Editor), Donald J. Svetkoff (Editor), Katherine Creath
Society of Photo-optical Instrumentation Engineers; ISBN: 0819429813
(December 1998) and ISBN: 0819434280 (December 1999)
6. Automated Optical Inspection for Industry: Theory, Technology, and
Applications II: 16-19 September 1998 Beijing, China (Spie Proceedings
Series, vo
4
by Shenghua Ye (Editor) Society of Photo-optical Instrumentation Engineers;
ISBN: 0819430196; (August 1998))
7. Optical Measurement Systems for Industrial Inspection: Application in
Industrial Design
by Wolfgang Osten (Editor), Malgorzata Kujawinska (Editor), Werner P. O. Juptner
(Editor) SPIE-Intl Society for Optical Engineering; ISBN: 0819440930; (October
2001)
8. Optical Measurement Systems for Industrial Inspection: Applications in
Production Engineering
by Roland Hofling (Editor), Malgorzata Kujawinska (Editor), Werner P. O. Juptner
(Editor) SPIE-Intl Society for Optical Engineering; ISBN: 0819440949;
(October 2001)
9. Optical Inspection and Micromeasurements II: 16-19 June 1997, Munich, Frg
SPIE-Intl Society for Optical Engineering; ISBN: 0819425184; (January
1997)
10. Optical 3d Measurement Techniques II: Applications in Inspection, Quality
Control, and Robotics (Spie, Vol 2252)
by Armin Gruen (Editor), Heribert Kahmen (Editor) Society of Photo-optical
Instrumentation Engineers; ASIN: 0819415618; (March 1994)
11. Automated Optical Inspection for Industry: 6-7 November 1996, Beijing,
China
by Frederick Y. Wu (Editor), Shenghua Ye (Editor) SPIE-Intl Society for
Optical Engineering; ISBN: 0819423009; (January 1996)
12. Optical Microlithographic Technology for Integrated Circuit Fabrication and
Inspection
by Stover (Editor) Society of Photo-optical Instrumentation Engineers;
ASIN: 089252846X; (April 1987)
13. Automated Inspection and High Speed Vision Architectures, III (Spie
Proceedings, Vol 1197)
by Michael J.W. Chen (Editor) Society of Photo-optical Instrumentation
Engineers; ISBN: 0819402362; (May 1990) |
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評量方式
(僅供參考) |
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週次 |
日期 |
單元主題 |
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第1週 |
2/24 |
Introduction of the subject and automated optical inspection |
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第2週 |
3/03 |
Optical system design and image analysis |
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第3週 |
3/10 |
Using CodeV for optical system design and case study |
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第4週 |
3/17 |
Image processing techniques and case study in AOI |
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第5週 |
3/24 |
2-D Defect detection in AOI: Matching algorithm
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第6週 |
3/31 |
OPENCV programming techniques and case study in 2D detection |
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第7週 |
4/07 |
OPENCV Practice: defect detection |
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第8週 |
4/14 |
External expert 1:2-D inspection case study and application (Professor 邱奕契) |
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第9週 |
4/21 |
3-D Fundamentals in AOI |
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第10週 |
4/28 |
Middle examination
(it will cover all the materials delivered in the class before 15th of April) |
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第11週 |
5/05 |
Microscopic 3-D measurement techniques: Basic concepts |
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第12週 |
5/12 |
Microscopic 3-D measurement techniques (1): White light interferometry and principle |
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第13週 |
5/19 |
Introduction of WLI |
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第14週 |
5/26 |
Confocal microscopic measurement |
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第15週 |
6/02 |
Confocal microscopy (II) |
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第16週 |
6/09 |
Surface defect detection algorithm |
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第17週 |
6/16 |
Labwork at Metrology Lab |
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第18週 |
6/23 |
Final examination |
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